Tip-induced artifacts in magnetic force microscopy images
نویسندگان
چکیده
منابع مشابه
Tip-induced artifacts in magnetic force microscopy images
Useful sample information can be extracted from the dissipation in frequency modulation atomic force microscopy due to its correlation to important material properties. It has been recently shown that artifacts can often be observed in the dissipation channel, due to the spurious mechanical resonances of the atomic force microscope instrument when the oscillation frequency of the force sensor c...
متن کاملRemoval of electrostatic artifacts in magnetic force microscopy by controlled magnetization of the tip: application to superparamagnetic nanoparticles
Magnetic force microscopy (MFM) has been demonstrated as valuable technique for the characterization of magnetic nanomaterials. To be analyzed by MFM techniques, nanomaterials are generally deposited on flat substrates, resulting in an additional contrast in MFM images due to unavoidable heterogeneous electrostatic tip-sample interactions, which cannot be easily distinguished from the magnetic ...
متن کاملMagnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
متن کاملMagnetic resonance force microscopy with a ferromagnetic tip mounted on the force detector.
The Magnetic Resonance Force Microscope (MRFM) presents the opportunity for a magnetic resonance imaging probe with ultra-high, potentially atomic-scale, resolution. The successful application of this technique in detection of nuclear magnetic, electron-spin and ferromagnetic resonance (FMR) highlights its significant potential. We discuss the capabilities of the MRFM with particular emphasis o...
متن کاملHigh Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)
In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution an...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2013
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.4776669